SCALE SELECTION
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Atsushi Imiya
- Max A. Viergever
- Tomoya Sakai
- J. Andrew Bangham
- Songde Ma
- Joachim Weickert
- Michael Felsberg
- Arjan Kuijper
- Alan L. Yuille
- Jan-Olof Eklundh
- Marco Loog
- Alfons H. Salden
- Richard W. Harvey
- Jean-Michel Morel
- Jinhai Li
- Kim Steenstrup Pedersen
- Christopher J. Taylor
- Mads Nielsen
- Jan J. Koenderink
- João Batista Florindo
- Ali Shokoufandeh
- Fahad Shahbaz Khan
- Carlos Lopez-Molina
- Makoto Sato
- Michael Brady
- Jon Sporring
- Walter G. Kropatsch
- B. S. Manjunath
- Baojiang Zhong
- Iasonas Kokkinos
- Qing Yang
- António M. G. Pinheiro
- Iris Vanhamel
- Hichem Sahli
- Andrea Vedaldi
- Pietro Perona
Venues
- CoRR
- Scale-Space
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- SSVM
- Pattern Recognit.
- ICIP
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- ICPR
- IEEE Trans. Image Process.
- ICASSP
- BMVC
- Int. J. Comput. Vis.
- Image Vis. Comput.
- ICCV
- Neurocomputing
- ECCV (1)
- Remote. Sens.
- ISBI
- Medical Imaging: Image Processing
- Inf. Sci.
- ICIP (1)
- J. Comput. Phys.
- Int. J. Approx. Reason.
- EUSIPCO
- IGARSS
- J. Vis. Commun. Image Represent.
- Comput. Vis. Image Underst.
- WACV
- EMBC
- CVPR (1)
- IEEE Signal Process. Lett.
- Multim. Tools Appl.
- IEEE Trans. Vis. Comput. Graph.
- INTERSPEECH
- AAAI
- Signal Process.
- IEEE Trans. Geosci. Remote. Sens.
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