SEM Image Analysis for Quality Control of Nanoparticles.
Simon K. AlexanderRobert AzencottBernhard G. BodmannAli BouamraniCiro ChiappiniMauro FerrariX. LiuEnnio TasciottiPublished in: CAIP (2009)
Keyphrases
- quality control
- image analysis
- machine vision
- quality assurance
- automated visual inspection
- manufacturing systems
- pattern recognition
- manufacturing process
- mathematical morphology
- image segmentation
- multispectral
- image processing
- computer vision
- scale space
- visual inspection
- product quality
- texture classification
- computer aided
- real time
- medical imaging
- image enhancement
- multiscale
- texture analysis
- rate control
- proceedings of the th international conference
- software development
- quality management
- neural network