A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection.
Nana Kankam GyimahAbenezer GirmaM. Nabil MahmoudShamila NateghiAbdollah HomaifarDaniel OpokuPublished in: CoRR (2021)
Keyphrases
- defect detection
- local binary pattern
- feature descriptors
- feature extraction
- textured surfaces
- texture classification
- face recognition
- multiscale
- texture features
- three dimensional
- texture information
- illumination invariant
- texture analysis
- spatial information
- post processing
- rotation invariant
- texture descriptors
- machine learning
- background subtraction
- color information
- object detection
- image descriptors
- image sequences