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Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers.

Christos PapameletisBrion L. KellerVivek ChickermaneErik Jan MarinissenSaid Hamdioui
Published in: ETS (2013)
Keyphrases
  • test generation
  • test cases
  • frequency domain
  • test sequences
  • information technology
  • static analysis
  • machine learning
  • artificial intelligence
  • high level
  • image quality
  • quality assurance