RDIS: Tolerating Many Stuck-At Faults in Resistive Memory.

Rakan Maddah Rami G. Melhem Sangyeun Cho

Published in: IEEE Trans. Computers (2015)

Keyphrases

software systems
fault diagnosis
memory requirements
memory usage
memory space
machine learning
memory size
fault detection
artificial intelligence
website
main memory
error detection
model based diagnosis
multiple faults
fault model
memory management
computing power
databases
error correction
real world