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Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper.

Michiel VandemaeleBen KaczerErik BuryJacopo FrancoAdrian ChasinAlexander MakarovHans MertensGeert HellingsGuido Groeseneken
Published in: IRPS (2023)
Keyphrases
  • invited paper
  • computer aided design
  • reliability analysis
  • databases
  • highly reliable
  • genetic algorithm
  • information technology
  • numerical simulations