Test generation for cyclic combinational circuits.

Anand Raghunathan Pranav Ashar Sharad Malik

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)

Keyphrases

test generation
logic circuits
asynchronous circuits
test cases
symbolic execution
test sequences
static analysis
software testing
design automation
mutation testing
low power
quality assurance
high speed
circuit design
databases
data sets
database systems