On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors.
Richard BramleyYanxiang HuangGuangshan DuanNirmal R. SaxenaPaul RacunasPublished in: ITC (2020)
Keyphrases
- failure rate
- signal processor
- embedded processors
- storage capacity
- occurrence probability
- fault diagnosis
- parallel algorithm
- distributed memory
- highly parallel
- parallel computers
- fault detection
- random variables
- parallel computing
- parallel processing
- low power
- single chip
- signal processing
- graphical models
- fault model
- decision trees
- parallel implementation
- precision and recall
- probability distribution
- lower bound
- bayesian networks