Architectural level test generation for microprocessors.

Jaushin Lee Janak H. Patel

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)

Keyphrases

test generation
test cases
design automation
software architecture
mutation testing
symbolic execution
test sequences
quality assurance
static analysis
personal computer
software testing
machine learning
pattern matching
query processing
multi agent systems
database systems
image processing