PDF testability of a combinational circuit derived by covering ROBDD nodes using Invert-And-Or circuits.
Toral ShahAnzhela Yu. MatrosovaVirendra SinghPublished in: VDAT (2015)
Keyphrases
- logic circuits
- tunnel diode
- high speed
- delay insensitive
- analog circuits
- asynchronous circuits
- electronic circuits
- analog vlsi
- low power
- circuit design
- logic synthesis
- digital circuits
- probability density function
- power dissipation
- vlsi circuits
- neural network
- directed graph
- network structure
- low cost
- radon transform
- decision diagrams
- fault diagnosis
- shortest path