High-temperature performance of state-of-the-art triple-gate transistors.
Kerem AkarvardarAbdelkarim MerchaEddy SimoenVaidyanathan SubramanianCor ClaeysPierre GentilSorin CristoloveanuPublished in: Microelectron. Reliab. (2007)
Keyphrases
- high temperature
- cmos technology
- silicon dioxide
- field effect transistors
- space charge
- low power
- power consumption
- high density
- low voltage
- steady state
- integrated circuit
- parallel processing
- metal oxide semiconductor
- flip flops
- diesel engine
- multiple input
- low cost
- circuit design
- power dissipation
- mathematical analysis
- input output
- leakage current
- image sequences