A test generation program for sequential circuits.
Enrico MaciiAngelo Raffaele MeoPublished in: J. Electron. Test. (1994)
Keyphrases
- test generation
- symbolic execution
- test cases
- static analysis
- mutation testing
- design automation
- test sequences
- high speed
- quality assurance
- software testing
- test data generation
- source code
- test set
- artificial intelligence
- databases
- life cycle
- circuit design
- error rate
- image quality
- regression testing
- programming language
- multi agent systems
- information systems