Generation of High Quality Tests for Robustly Untestable Path Delay Faults.
Kwang-Ting ChengAngela KrsticHsi-Chuan ChenPublished in: IEEE Trans. Computers (1996)
Keyphrases
- high quality
- test cases
- fault diagnosis
- case study
- low quality
- multiple faults
- high resolution
- ground truth
- fault detection
- database
- highly accurate
- fault detection and diagnosis
- generation process
- model based diagnosis
- higher quality
- source code
- endpoints
- shortest path
- super resolution
- critical path
- destination node
- real time