A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection.
Nana Kankam GyimahAbenezer GirmaMahmoud Nabil MahmoudShamila NateghiAbdollah HomaifarDaniel OpokuPublished in: SMC (2021)
Keyphrases
- defect detection
- local binary pattern
- feature extraction
- textured surfaces
- feature descriptors
- texture classification
- face recognition
- texture features
- texture analysis
- texture information
- texture descriptors
- multiscale
- rotation invariant
- spatial information
- illumination invariant
- keypoints
- three dimensional
- multi class
- preprocessing
- image descriptors
- multiresolution
- object recognition