Interlocked test generation and digital hardware synthesis.
Fredrick J. HillPublished in: Great Lakes Symposium on VLSI (1991)
Keyphrases
- test generation
- test cases
- circuit design
- symbolic execution
- low cost
- design automation
- test sequences
- real time
- mutation testing
- static analysis
- hardware and software
- computer systems
- quality assurance
- software testing
- camera phones
- regression testing
- open source
- image processing
- databases
- knowledge management
- test data generation
- learning algorithm
- machine learning