DSP-Based Statistical Self Test of On-Chip Converters.

Hak-soo Yu Sungbae Hwang Jacob A. Abraham

Published in: VTS (2003)

Keyphrases

high speed
statistical significance
low cost
statistical tests
signal processing
statistical analysis
test data
statistical models
built in self test
image processing
post hoc
pattern recognition
high density
data driven
goodness of fit
vlsi implementation
vlsi design
software development