Automated debugging from pre-silicon to post-silicon.

Mehdi Dehbashi Görschwin Fey

Published in: DDECS (2012)

Keyphrases

low cost
high density
high speed
artificial intelligence
machine learning
semi automated
gallium arsenide
fully automated
silicon dioxide
image processing
case study
data structure
model based diagnosis
field effect transistors
transmission electron microscopy
plasma etching