Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test.

Edward B. Eichelberger Eric Lindbloom

Published in: IBM J. Res. Dev. (1983)

Keyphrases

test suite
set of test cases
image processing
logic programming
pattern matching
fault diagnosis
test cases
modal logic
statistical tests
model based diagnosis
clinically relevant
test data
inference rules
software testing
uniformly distributed