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Effect of Gate Dielectric Thickness on the Performance of Top-Down ZnO Nanowire Field-Effect Transistors.
Nor Azlin Ghazali
Mohamed Fauzi Packeer Mohamed
Muhammad Firdaus Akbar
Harold M. H. Chong
Published in:
RoViSP (2021)
Keyphrases
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field effect transistors
high density
thin film
schottky barrier
steady state
gate dielectrics
mathematical analysis
data center
artificial intelligence
chemical vapor deposition
high level
image segmentation
film thickness
silicon dioxide
search engine
leakage current
machine learning