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A built-in supply current test circuit for electrical interconnect tests of 3D ICs.
Masaki Hashizume
Shoichi Umezu
Hiroyuki Yotsuyanagi
Shyue-Kung Lu
Published in:
3DIC (2014)
Keyphrases
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low voltage
high speed
short circuit
distribution networks
test data
test cases
electronic circuits
post hoc
statistical tests
multiple choice
data sets
transmission line
null hypothesis
test suite
low cost
case study
neural network