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Optical semiconductor device reliability.
Mitsuo Fukuda
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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semiconductor devices
electron beam
field effect transistors
reliability analysis
neural network
atmospheric turbulence
highly reliable
failure rate
high density
semiconductor manufacturing
database
x ray
physical characteristics
fiber optic
case study
portable devices
artificial intelligence
gallium arsenide