An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner.
Jianxiong LiQian ZhouXinghui LiRuiming ChenKai NiPublished in: Sensors (2019)
Keyphrases
- laser scanner
- laser beam
- high noise
- data processing
- real time
- noise level
- low signal to noise ratio
- image noise
- signal to noise ratio
- low memory requirements
- high levels
- line segments
- information processing
- sensor array
- high resolution
- noise model
- case study
- noise sensitivity
- laser radar
- quality control
- defect detection
- random noise
- image structure
- noisy data
- edge detection
- color images
- data mining
- neural network