Fast Test Generation for Structurally Similar Circuits.

Jerin Joe Nilanjan Mukherjee Irith Pomeranz Janusz Rajski

Published in: VTS (2022)

Keyphrases

test generation
test cases
test sequences
symbolic execution
design automation
high speed
static analysis
databases
quality assurance
artificial intelligence
information systems
case study
high level
video sequences
delay insensitive