Fault-Aware ECC Techniques for Reliability Enhancement of Flash Memory.
Shyue-Kung LuZeng-Long TsaiChun-Lung HsuChi-Tien SunPublished in: VLSI-DAT (2020)
Keyphrases
- flash memory
- garbage collection
- buffer management
- solid state
- random access
- error detection
- main memory
- file system
- embedded systems
- error correction
- fault tree
- disk drives
- data storage
- fault diagnosis
- image enhancement
- image processing
- b tree
- database systems
- fault detection
- small size
- storage devices
- memory management
- failure rate
- general purpose
- elliptic curve
- data model
- feature space
- multi agent systems
- hand held devices
- artificial intelligence