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Condition Monitoring of SiC MOSFETs Based on Gate-Leakage Current Estimation.
Patrick Wang
Joseph Zatarski
Arijit Banerjee
John S. Donnal
Published in:
IEEE Trans. Instrum. Meas. (2022)
Keyphrases
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condition monitoring
leakage current
low voltage
fault detection
fault diagnosis
design considerations
power line
silicon dioxide
nuclear power plant
cmos technology
acoustic emission
power transformers
power management
electrical properties