Verification of Sequential Circuits by Tests-As-Proofs Paradigm.
Eugene GoldbergMitesh JainPanagiotis ManoliosPublished in: CoRR (2013)
Keyphrases
- asynchronous circuits
- high speed
- formal proof
- test generation
- test data
- face verification
- delay insensitive
- model checking
- theorem prover
- signature verification
- functional verification
- sequential search
- tunnel diode
- face recognition
- formal proofs
- false acceptance rate
- logic circuits
- formal verification
- formal methods
- sequential data
- computer programs
- test cases