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Experts
- Javier Ortega-Garcia
- Umapada Pal
- Michael Blumenstein
- Wataru Ohyama
- Rubén Vera-RodrÃguez
- Rubén Tolosana
- Miguel A. Ferrer
- Giuseppe Pirlo
- Julian Fiérrez
- Jiajia Jiang
- Suraiya Jabin
- Julian Fiérrez-Aguilar
- Lianwen Jin
- Richard M. Guest
- Donato Impedovo
- César Sánchez
- Susan Hohenberger
- Sargur N. Srihari
- Marcus Liwicki
- Martin Leucker
- Muhammad Imran Malik
- Alireza Alaei
- Tetsushi Wakabayashi
- Michael Østergaard Pedersen
- Javier Galbally
- Moisés DÃaz
- Srikanta Pal
- Rolf Ingold
- Abhijit Das
- Farhana Javed Zareen
- George Economou
- Taiping Zhang
- Fumitaka Kimura
- C. Elisa van den Heuvel
- Andreas Fischer
- Ranko Lazic
- Bin Fang
- Songxuan Lai
- Dimitrios Tsourounis
Venues
- CoRR
- ICDAR
- IACR Cryptol. ePrint Arch.
- Int. J. Pattern Recognit. Artif. Intell.
- ICPR
- Pattern Recognit.
- ICFHR
- DAC
- RV
- IET Biom.
- ACM SIGLOG News
- ICB
- Pattern Recognit. Lett.
- Formal Methods Syst. Des.
- ICCST
- Expert Syst. Appl.
- OFC
- ACPR
- ISoLA (2)
- AFHA
- CAV
- VTS
- ACM SIGSOFT Softw. Eng. Notes
- Biomed. Signal Process. Control.
- CLEF (Working Notes)
- BioCAS
- CVPR
- FME
- IEEE Access
- J. Syst. Softw.
- IEEE Trans. Instrum. Meas.
- IJCNN
- IEEE Trans. Inf. Forensics Secur.
- IEEE Trans. Syst. Man Cybern.
- BIOID
- ICARCV
- ICASSP
- Sensors
- Formal Aspects Comput.
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