Per-patch metric learning for robust image matching.
Sezer KaraogluIvo EvertsJan C. van GemertTheo GeversPublished in: ICIP (2015)
Keyphrases
- image matching
- metric learning
- illumination variations
- wide baseline matching
- feature descriptors
- matching algorithm
- distance metric learning
- distance metric
- scale invariant feature transform
- keypoints
- affine distortion
- image pairs
- learning tasks
- object recognition
- image registration
- semi supervised
- multi task
- computer vision
- pairwise
- feature matching
- distance function
- dimensionality reduction
- mahalanobis metric
- feature space
- multi class
- image retrieval
- semi supervised learning
- image matching method
- image patches
- scale space
- mutual information
- image analysis
- sift descriptors
- machine learning