SIFT DESCRIPTORS
Experts
- Qi Tian
- Qingming Huang
- Wen Gao
- Yen-Wei Chen
- Fabio Bellavia
- Andrzej Sluzek
- Yu Qiao
- Hunny Mehrotra
- Yue Lu
- Alberto Del Bimbo
- Chengjun Liu
- Xian-Hua Han
- Xi Chen
- J. M. Hans du Buf
- Shiliang Zhang
- Banshidhar Majhi
- Hitoshi Kiya
- Takafumi Aoki
- Julie Delon
- Hongxun Yao
- Sugata Banerji
- Chunjie Zhang
- Cordelia Schmid
- Edwige E. Pissaloux
- Robert Sablatnig
- Xiang Ruan
- Carlo Colombo
- Bo Li
- Radu Horaud
- Atreyee Sinha
- Di Huang
- Qi Jia
- Yang-Sae Moon
- Jiantao Zhou
- Jitendra Malik
- Danni Ai
- Yiding Wang
- Gang Hua
- Andrew Zisserman
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- ICPR
- Remote. Sens.
- Pattern Recognit. Lett.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Access
- Pattern Recognit.
- ICCV
- IEEE Trans. Geosci. Remote. Sens.
- Sensors
- IGARSS
- IEEE Trans. Image Process.
- Neurocomputing
- CVPR Workshops
- ICME
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- ICRA
- ICASSP
- J. Electronic Imaging
- IEICE Trans. Inf. Syst.
- MVA
- VISAPP (2)
- WACV
- Int. J. Comput. Vis.
- ACM Multimedia
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- NeuroImage
- J. Vis. Commun. Image Represent.
- SMC
- Expert Syst. Appl.
- Int. J. Pattern Recognit. Artif. Intell.
- Image Vis. Comput.
- IJCNN
- IET Image Process.
- IEEE Trans. Inf. Forensics Secur.
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