SIFT DESCRIPTORS
Experts
- Qingming Huang
- Qi Tian
- Wen Gao
- Yen-Wei Chen
- Fabio Bellavia
- Andrzej Sluzek
- Hunny Mehrotra
- Yue Lu
- Xian-Hua Han
- Alberto Del Bimbo
- Yu Qiao
- Chengjun Liu
- Banshidhar Majhi
- J. M. Hans du Buf
- Xi Chen
- Shiliang Zhang
- Hitoshi Kiya
- Di Huang
- Chong-Wah Ngo
- Cordelia Schmid
- Danni Ai
- Yang-Sae Moon
- Bo Li
- Hongxun Yao
- Edwige E. Pissaloux
- Robert Sablatnig
- Takafumi Aoki
- Xiang Ruan
- Sugata Banerji
- Julie Delon
- Yiding Wang
- Rongrong Ji
- Chunjie Zhang
- Atreyee Sinha
- Andrew Zisserman
- Radu Horaud
- Tat-Jen Cham
- Qi Jia
- Jiantao Zhou
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- ICPR
- Remote. Sens.
- Pattern Recognit. Lett.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Access
- Pattern Recognit.
- IEEE Trans. Geosci. Remote. Sens.
- ICCV
- IEEE Trans. Image Process.
- IGARSS
- Neurocomputing
- CVPR Workshops
- Sensors
- ICME
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- J. Electronic Imaging
- IEICE Trans. Inf. Syst.
- ICRA
- MVA
- VISAPP (2)
- WACV
- Int. J. Comput. Vis.
- NeuroImage
- J. Vis. Commun. Image Represent.
- ACM Multimedia
- SMC
- Image Vis. Comput.
- Expert Syst. Appl.
- Int. J. Pattern Recognit. Artif. Intell.
- ISVC (2)
- IROS
- ICIG
- IEEE Trans. Inf. Forensics Secur.
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