SIFT DESCRIPTORS
Experts
- Qi Tian
- Qingming Huang
- Wen Gao
- Fabio Bellavia
- Andrzej Sluzek
- Yen-Wei Chen
- Yu Qiao
- Alberto Del Bimbo
- Hunny Mehrotra
- Xian-Hua Han
- Yue Lu
- Chengjun Liu
- Hitoshi Kiya
- Xi Chen
- J. M. Hans du Buf
- Shiliang Zhang
- Banshidhar Majhi
- Xiang Ruan
- Jiantao Zhou
- Jitendra Malik
- Atreyee Sinha
- Yiding Wang
- Sugata Banerji
- Di Huang
- Andrew Zisserman
- Carlo Colombo
- Radu Horaud
- Takafumi Aoki
- Julie Delon
- Robert Sablatnig
- Edwige E. Pissaloux
- Hongxun Yao
- Chunjie Zhang
- Cordelia Schmid
- Tat-Jen Cham
- Rongrong Ji
- Qi Jia
- Danni Ai
- Gang Hua
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- ICPR
- Remote. Sens.
- Pattern Recognit. Lett.
- IEEE Geosci. Remote. Sens. Lett.
- Pattern Recognit.
- IEEE Access
- IEEE Trans. Geosci. Remote. Sens.
- ICCV
- Sensors
- IEEE Trans. Image Process.
- IGARSS
- Neurocomputing
- CVPR Workshops
- ICME
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- ICRA
- BMVC
- J. Electronic Imaging
- IEICE Trans. Inf. Syst.
- MVA
- Int. J. Comput. Vis.
- WACV
- VISAPP (2)
- SMC
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- NeuroImage
- ACM Multimedia
- J. Vis. Commun. Image Represent.
- Int. J. Pattern Recognit. Artif. Intell.
- Image Vis. Comput.
- Expert Syst. Appl.
- IEEE Trans. Inf. Forensics Secur.
- ICIG
- ISVC (2)
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