Thorough testing of any multiport memory with linear tests.
Said HamdiouiAd J. van de GoorPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
- test generation
- test suite
- test cases
- statistical tests
- test data
- memory space
- memory requirements
- main memory
- limited memory
- closed form
- random access
- machine learning
- real world
- linear complexity
- external memory
- database
- memory size
- piecewise linear
- artificial neural networks
- data streams
- image processing
- databases
- real time