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high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress.
S. Chatterjee
Yue Kuo
J. Lu
J.-Y. Tewg
P. Majhi
Published in:
Microelectron. Reliab. (2006)
Keyphrases
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field effect transistors
gate dielectrics
high density
electrical properties
steady state
bayesian networks
power system
mathematical analysis
si sio
machine learning
thin film
metal oxide
data sets
wide range
structure learning
power supply