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Modeling the behavior of amorphous oxide thin film transistors before and after bias stress.
Antonio Cerdeira
Magali Estrada
Blanca S. Soto-Cruz
Benjamín Iñíguez
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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thin film
high density
electron microscopy
room temperature
silicon nitride
short circuit
multi layer
grain size
solar cell
low density
power consumption
chemical vapor deposition
white light interferometry
database
simulation model
steady state
learning algorithm
databases