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A 24Gb/s/pin PAM-4 Built Out Tester chip enabling PAM-4 chips test with NRZ interface ATE.

Hyungmin JinJindo ByunHyunyoon ChoHojun YoonJin-Hee ParkKyoungsoo KimYoungdon ChoiJung-Hwan ChoiHyungjong KoSang-Hyun Lee
Published in: A-SSCC (2021)
Keyphrases
  • high speed
  • high density
  • test cases
  • user interface
  • software testing
  • search engine
  • communication protocol
  • neural network
  • software development
  • test data
  • user friendly
  • testing process