Guided gate-level ATPG for sequential circuits using a high-level test generation approach.

Bijan Alizadeh Masahiro Fujita

Published in: ASP-DAC (2010)

Keyphrases

test generation
high level
higher level
low level
lower level
test cases
static analysis
symbolic execution
data sets
high speed
pattern matching
cmos technology
design automation
data exchange
software testing
quality assurance
decision trees
test sequences
multiple input
learning algorithm