Design of a BIST RAM with Row/Column Pattern Sensitive Fault Detection Capability.

Manoj Franklin Kewal K. Saluja Kozo Kinoshita

Published in: ITC (1989)

Keyphrases

fault detection
industrial processes
row column
tennessee eastman
fault diagnosis
fault identification
failure detection
feature extraction
euclidean distance
data mining
high dimensional data
fixed point
fault isolation