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Hybrid BIST optimization using reseeding and test set compaction.

Gert JervanElmet OrassonHelena KruusRaimund Ubar
Published in: Microprocess. Microsystems (2008)
Keyphrases
  • test set
  • error rate
  • training set
  • training data
  • test data
  • evaluation methodology
  • optimization algorithm
  • test cases
  • class distribution
  • data sets
  • support vector machine
  • linear combination
  • training and test sets