Test generation for cyclic combinational circuits.

Anand Raghunathan Pranav Ashar Sharad Malik

Published in: VLSI Design (1995)

Keyphrases

test generation
logic circuits
asynchronous circuits
test cases
symbolic execution
design automation
static analysis
test sequences
quality assurance
mutation testing
software testing
low power
machine learning
power dissipation
high speed
code coverage
monitoring system
artificial intelligence