Scalable Test Generation to Trigger Rare Targets in High-Level Synthesizable IPs for Cloud FPGAs.
Mukta DebnathAnimesh Basak ChowdhuryDebasri SahaSusmita Sur-KolayPublished in: CoRR (2024)
Keyphrases
- test generation
- high level
- field programmable gate array
- low level
- test cases
- symbolic execution
- cloud computing
- design automation
- static analysis
- test sequences
- hardware implementation
- embedded systems
- quality assurance
- software testing
- map reduce
- mutation testing
- programming language
- parallel computing
- hardware design
- computing systems
- test set
- test data generation
- databases
- image processing algorithms
- vision system