Parallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors.
Srinivas PatilPrithviraj BanerjeeJanak H. PatelPublished in: DAC (1991)
Keyphrases
- test generation
- general purpose
- parallel implementation
- distributed memory
- shared memory
- test cases
- parallel version
- symbolic execution
- data parallelism
- design automation
- special purpose
- parallel processing
- static analysis
- parallel algorithm
- test sequences
- graphics processing units
- programming language
- code coverage
- database
- mutation testing
- parallel architecture
- quality assurance
- software testing
- parallel programming
- development process
- case study