Surface Defect System for Long Product Manufacturing Using Differential Topographic Images.
F. J. delaCalle HerreroDaniel F. GarcíaRubén UsamentiagaPublished in: Sensors (2020)
Keyphrases
- three dimensional
- image database
- input image
- image classification
- image retrieval
- high contrast
- image analysis
- test images
- image data
- ground truth
- image features
- image registration
- object recognition
- image matching
- acquired images
- keypoints
- medical images
- surface features
- skin surface
- viewing angle
- production planning
- feature points
- edge detection
- multiple images
- quality control
- geometric structure
- illumination conditions
- reconstruction process
- surface shape
- range data
- image regions
- segmentation method
- surface defects