Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree.

Gang Zeng Hideo Ito

Published in: IEICE Trans. Inf. Syst. (2006)

Keyphrases

data mining
test set
error rate
training set
test data
test cases
training data
tree structure
low power
evaluation methodology
database
hardware and software
low resolution
multi class
face detector
concurrent programs
training and test sets