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Construction of SEU Tolerant Flip-Flops Allowing Enhanced Scan Delay Fault Testing.

Kazuteru NambaTakashi IkedaHideo Ito
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
  • power dissipation
  • flip flops
  • fault diagnosis
  • fault model
  • fault detection
  • multiple input
  • digital images
  • real time embedded systems
  • neural network
  • video data
  • test cases
  • dynamic range