Infrared face recognition based on local binary patterns and Kruskal-Wallis test.
Zhengzi WangZhihua XiePublished in: ICIS (2014)
Keyphrases
- feature descriptors
- local binary pattern
- infrared
- face recognition
- texture classification
- texture analysis
- multiscale
- feature extraction
- texture features
- thermal infrared
- infrared images
- infrared imagery
- visible light
- texture descriptors
- texture information
- face detection
- rotation invariant
- spatial information
- face images
- facial expression recognition
- hyperspectral
- background subtraction
- face databases
- visible spectrum
- principal component analysis
- human faces
- multiresolution
- face verification
- computer vision
- facial expressions
- sparse representation
- texture images
- pattern recognition
- state space
- image representation