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Influence of Resistive Bridging Fault on Crosstalk Coupling Effects in On-Chip Aggressor-Victim Interconnects.
Ajoy Kumar Palit
Kishore K. Duganapalli
Walter Anheier
Published in:
DFT (2006)
Keyphrases
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individual differences
high speed
power dissipation
prior studies
fault diagnosis
high density
low cost
failure modes
input output
vlsi design
cmos technology
individual level
fault detection
programmable logic
real time
digital divide
single chip
low power
image processing
neural network