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New BIST Techniques for Universal and Robust Testing of CMOS Stuck-Open Faults.
Debesh Kumar Das
Susanta Chakraborty
Bhargab B. Bhattacharya
Published in:
VLSI Design (1997)
Keyphrases
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test cases
fault diagnosis
fault model
real time
low cost
computationally efficient
built in self test
database
knowledge base
case study
pose estimation
fault detection
robust estimation
circuit design
power supply
root cause