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On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits.
Ruifeng Guo
Sudhakar M. Reddy
Irith Pomeranz
Published in:
Asian Test Symposium (2001)
Keyphrases
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data generator
high speed
test cases
built in self test
fault diagnosis
bayesian networks
hidden markov models
information systems
database
learning algorithm
fault detection
sequential data
analog circuits
quantum computing
information retrieval
fault models
machine learning