Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs.
Michiel VandemaeleBen KaczerStanislav TyaginovErik BuryAdrian ChasinJacopo FrancoAlexander MakarovHans MertensGeert HellingsGuido GroesenekenPublished in: IRPS (2022)