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Parametric Fault Testing and Performance Characterization of Post-Bond Interposer Wires in 2.5-D ICs.

Li-Ren HuangShi-Yu HuangKun-Han TsaiWu-Tung Cheng
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2014)
Keyphrases
  • fault detection
  • fault diagnosis
  • fault model
  • test cases
  • test set
  • information systems
  • training data
  • data sets
  • genetic algorithm
  • website
  • multiresolution
  • fault injection