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An array-based test circuit for fully automated gate dielectric breakdown characterization.
John Keane
Shrinivas Venkatraman
Paulo F. Butzen
Chris H. Kim
Published in:
CICC (2008)
Keyphrases
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fully automated
fully automatic
semi automated
manual segmentation
completely automated
leakage current
test cases
high speed
labor intensive
cmos technology
low voltage
silicon dioxide
nm technology
semi automatic
software testing
analog circuits