Shrinivas Venkatraman

Publication Activity (10 Years)

Years Active: 2008-2011
Publications (10 Years): 0

Publications

John Keane, Shrinivas Venkatraman, Paulo F. Butzen, Chris H. Kim
An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization. IEEE Trans. Very Large Scale Integr. Syst. 19 (5) (2011)
John Keane, Shrinivas Venkatraman, Paulo F. Butzen, Chris H. Kim
An array-based test circuit for fully automated gate dielectric breakdown characterization. CICC (2008)